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Monday, August 6, 2012

ML3303 CHARACTERIZATION OF MATERIALS SYLLABUS | ANNA UNIVERSITY BE MATERIALS SCIENCE AND ENGINEERING 5TH SEMESTER SYLLABUS REGULATION 2008 2011 2012-2013

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ML3303 CHARACTERIZATION OF MATERIALS SYLLABUS | ANNA UNIVERSITY BE MATERIALS SCIENCE AND ENGINEERING 5TH SEMESTER SYLLABUS REGULATION 2008 2011 2012-2013 BELOW IS THE ANNA UNIVERSITY FIFTH SEMESTER BE MATERIALS SCIENCE AND ENGINEERING DEPARTMENT SYLLABUS, TEXTBOOKS, REFERENCE BOOKS, IT IS APPLICABLE FOR ALL STUDENTS ADMITTED IN THE YEAR 2011 2012-2013 (ANNA UNIVERSITY CHENNAI,TRICHY,MADURAI,TIRUNELVELI,COIMBATORE), 2008 REGULATION OF ANNA UNIVERSITY CHENNAI AND STUDENTS ADMITTED IN ANNA UNIVERSITY CHENNAI DURING 2009


ML3303 CHARACTERIZATION OF MATERIALS L T P C
3 0 0 3
OBJECTIVE
Characterisation of materials is very important for studying the structure of materials and
to interpret their properties. The students study the theoretical foundations of
metallography, X- ray diffraction, electron diffraction, scanning electron microscopy,
chemical and thermal analysis.
UNIT I METALLOGRAPHIC TECHNIQUES 8
Resolution, depth of focus and components of microscope, polarized light, phase
contrast, interference microscopy, hot stage and quantitative metallographic techniques,
specimen preparation techniques.
UNIT II X-RAY DIFFRACTION TECHNIQUES 10
Crystallography basics, characteristic spectrum, Bragg’s law, Diffraction methods –
Laue, rotating crystal and powder methods. Stereographic projection. Intensity of
diffracted beams –structure factor calculations and other factors. Cameras- Laue,
Debye-Scherer cameras, Seeman-Bohlin focusing cameras.
UNIT III APPLICATION OF X-RAY DIFFRACTION 9
Diffractometer – general feature and optics, proportional, scintillating and Geiger
counters. X-ray diffraction application in the determination of crystal structure, lattice
parameter, phase diagram and residual stress – quantitative phase estimation, ASTM
catalogue of Materials identification
UNIT IV ELECTRON MICROSCOPY 9
Construction and operation of Transmission electron microscope – Diffraction effects
and image formation, specimen preparation techniques. Construction, modes of
operation and application of Scanning electron microscope, EDX. Electron probe micro
analysis, basics of scanning Tunneling Microscope (STM) and Atomic Force
Microscope.
UNIT V ADVANCED CHEMICAL AND THERMAL ANALYSIS 9
Basic principles, practice and applications of X-ray spectrometry, X-ray photoelectron
spectrometry, Auger spectroscopy, Differential thermal analysis DTA, Differential
scanning calorimetry DSC and thermogravimetric analysis TGA
TOTAL : 45 PERIODS
TEXT BOOKS
1. Cullity, B. D.,“ Elements of X-ray diffraction”, Addison-Wesley Company Inc., New
York, 3rd Edition, 2000.
2. Cherepin and Malik, “Experimental Techniques in Physical Metallurgy", Asia
Publishing Co. Bombay, 1968.
REFERENCES
1. Brandon D. G, “Modern Techniques in Metallography”, Von Nostrand Inc. NJ, USA,
1986.
2. Thomas G., “Transmission electron microscopy of metals”, John Wiley, 1996.
3. Weinberg, F., “Tools and Techniques in Physical Metallurgy”, Volume I & II, Marcel
and Decker, 1970.
4. Phillips, V. A., “Modern metallographic techniques and their application”, John-Wiley
& sons, 1972.
40
5. Haines, P. J., “Principles of Thermal Analysis and Calorimetry”, Royal Society of
Chemistry (RSC), Cambridge, 2002.

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